doc. no : qw0905- rev. : a date : - 2004 lfd4e5/62-xx 26 - nov lfd4e5/62-xx data sheet ligitek electronics co.,ltd. property of ligitek only office:7f.,no.208,sec.3,jhongyang rd.,tucheng city taipei hsien,taiwan r.o. tel:(02)22677686(rep) fax:(02)22675286,(02)2 2695616 four digit led display (0.4 inch)
note : 1.all dimension are in millimeters and (lnch) tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. part no. package dimensions lfd4e5/62-xx ligitek electronics co.,ltd. property of ligitek only page 1/7 39.2(1.543") 2.54x12=30.48 (1.2") pin no.1 lfd4e5/62-xx ligitek 10.16 (0.4") dig.1 dig.3 dig.2 dp2 uc dig.4 10.3(0.406") 6.4 (0.252") 12.55 ? 0.5 12.9 (0.508") ?? 0.45 typ d f e dp b g a c r 1.4(0.055)
ligitek electronics co.,ltd. property of ligitek only internal circuit diagram part no. 2/7 page c 4 c 4 3 13 1 10 5 2 dig. 3 b dig. 3 b a e 6 g f dig. 4 c d b f g d e 8 c a dig. 4 6 e g f c d b f g d e c 8 d dp2 a uc f g e 9 3 13 dig. 2 c b a 12 f g e d 1 10 5 2 d dp2 uc a g f e 9 dig. 2 c b a g f e d 12 lfd4e52-xx 11 7 lfd4e62-xx dig. 1 a b 11 7 dig. 1 a b lfd4e5/62-xx
22 11 10 12 9 8 7 6 3 4 5 common anode dig.3 common anode dig.4 11 12 common cathode dig.3 anode b common cathode dig.4 cathode b 10 9 8 7 4 6 5 3 pin no.1 part no. electrical connection 1 lfd4e62-xx ligitek electronics co.,ltd. property of ligitek only lfd4e52-xx pin no.1 1 page 3/7 common cathode dig.2,dp2,ug common anode dig.2,dp2,uc anode dp2 cathode dp2 common cathode dig.1 common anode dig.1 anode g cathode g anode c cathode c anode d cathode d anode e cathode e anode f cathode f anode a cathode a lfd4e5/62-xx 13 anode uc cathode uc 13
iv(mcd) typ. 1.75 operating temperature storage temperature part no lfd4e52-xx note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. part selection and application information(ratings at 25 ) j solder temperature 1-16 inch below seating plane for 3 seconds at 260 j common cathode or anode f p ( nm) ??f (nm) 565 green emitted material gap common cathode common anode 30 1.7 min. 2.6 max. 2.1 typ. 0.8 min. chip tstg t opr electrical vf(v) -25 ~ +85 -25 ~ +85 2:1 iv-m j j ligitek electronics co.,ltd. property of ligitek only parameter peak forward current per chip (duty 1/10,0.1ms pulse width) power dissipation per chip reverse current per any chip forward current per chip absolute maximum ratings at ta=25 j part no. pd ir i f i fp symbol 10 100 120 30 ratings g 4/7 page g a mw ma ma unit lfd4e62-xx lfd4e5/62-xx
luminous intensity matching ratio iv-m test condition for each parameter part no. forward voltage per chip luminous intensity per chip spectral line half-width peak wavelength reverse current any chip parameter page 5/7 vf volt ir ??f iv f p nm g a nm mcd symbol unit if=20ma if=20ma vr=5v if=10ma if=20ma test condition ligitek electronics co.,ltd. property of ligitek only lfd4e5/62-xx
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( j ) relative intensity@20ma wavelength (nm) forward voltage@20ma normalize @25 j fig.4 relative intensity vs. temperature ambient temperature( j ) relative intensity@20ma normalize @25 j typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage forward current(ma) page forward current(ma) fig.2 relative intensity vs. forward current relative intensity normalize @20ma ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0 10 100 1000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40 -20 0 20 40 60 1.0 1.1 1.2 500 550 600 650 0.0 0.5 1.0 2.0 3.0 4.0 5.0 80 100 0.8 0.9 -20 -40 40 20 080100 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 3.5 g chip part no. fig.6 directive radiation 6/7 lfd4e5/62-xx
thermal shock test high temperature high humidity test solder resistance test solderability test mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202:103b jis c 7021: b-11 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. 1.ta=65 j? 5 j 2.rh=90 %~95% 3.t=240hrs ? 2hrs 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. this test intended to see soldering well performed or not. the purpose of this test is the resistance of the device under tropical for hous. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. part no. test item operating life test high temperature storage test low temperature storage test reliability test: reference standard mil-std-883:1008 jis c 7021: b-10 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 ligitek electronics co.,ltd. property of ligitek only 1.under room temperature 2.if=10ma 3.t=1000 hrs (-24hrs, + 72hrs) 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) test condition this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. the purpose of this is the resistance of the device which is laid under ondition of hogh temperature for hours. description page 7/7 lfd4e5/62-xx
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